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Microstructural Characterization of Materials

Microstructural Characterization of Materials

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Authors: David Brandon, Wayne D. Kaplan
Publisher: Wiley
Category: Book

List Price: $80.00
Buy New: $56.93
You Save: $23.07 (29%)



New (10) Used (4) from $56.93

Sales Rank: 442921

Media: Paperback
Edition: 2
Number Of Items: 1
Pages: 550
Shipping Weight (lbs): 2
Dimensions (in): 9.6 x 6.2 x 1.3

ISBN: 0470027851
Dewey Decimal Number: 620.11299
EAN: 9780470027851
ASIN: 0470027851

Publication Date: June 10, 2008
Availability: Usually ships in 1-2 business days
Shipping: International shipping available
Condition: Good Condition, delivery time 10 to 12 Working days, via Priority airmail from UK

Also Available In:

  • Hardcover - Microstructural Characterization of Materials

Similar Items:

  • Introduction to the Thermodynamics of Materials, Fitfth Edition
  • Introduction to Diffraction in Materials Science and Engineering
  • Electronic Properties of Materials
  • Thermodynamics of Materials Volume II (Mit Series in Materials Science and Engineering)

Editorial Reviews:

Product Description
Microstructural characterization is usually achieved by allowing some form of probe to interact with a carefully prepared specimen. The most commonly used probes are visible light, X-ray radiation, a high-energy electron beam, or a sharp, flexible needle. These four types of probe form the basis for optical microscopy, X-ray diffraction, electron microscopy, and scanning probe microscopy.

Microstructural Characterization of Materials, 2nd Edition is an introduction to the expertise involved in assessing the microstructure of engineering materials and to the experimental methods used for this purpose. Similar to the first edition, this 2nd edition explores the methodology of materials characterization under the three headings of crystal structure, microstructural morphology, and microanalysis. The principal methods of characterization, including diffraction analysis, optical microscopy, electron microscopy, and chemical microanalytical techniques are treated both qualitatively and quantitatively. An additional chapter has been added to the new edition to cover surface probe microscopy, and there are new sections on digital image recording and analysis, orientation imaging microscopy, focused ion-beam instruments, atom-probe microscopy, and 3-D image reconstruction. As well as being fully updated, this second edition also includes revised and expanded examples and exercises, with a solutions manual available at http://develop.wiley.co.uk/microstructural2e/

Microstructural Characterization of Materials, 2nd Edition will appeal to senior undergraduate and graduate students of material science, materials engineering, and materials chemistry, as well as to qualified engineers and more advanced researchers, whowill find the book a useful and comprehensive general reference source.


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